Download PDF by Peter W. Epperlein: Semiconductor Laser Engineering, Reliability and

By Peter W. Epperlein

ISBN-10: 1119990335

ISBN-13: 9781119990338

This reference e-book offers an absolutely built-in novel method of the advance of high-power, single-transverse mode, edge-emitting diode lasers via addressing the complementary themes of equipment engineering, reliability engineering and equipment diagnostics within the comparable ebook, and hence closes the space within the present booklet literature.

Diode laser basics are mentioned, via an intricate dialogue of problem-oriented layout guidance and strategies, and via a scientific remedy of the origins of laser degradation and a radical exploration of the engineering ability to reinforce the optical energy of the laser. balance standards of severe laser features and key laser robustness components are mentioned in addition to transparent layout concerns within the context of reliability engineering techniques and types, and average courses for reliability assessments and laser product skills. Novel, complicated diagnostic tools are reviewed to debate, for the 1st time intimately in e-book literature, functionality- and reliability-impacting components comparable to temperature, rigidity and fabric instabilities.

Further key beneficial properties include:

  • practical layout instructions that think about additionally reliability similar results, key laser robustness components, easy laser fabrication and packaging issues;
  • detailed dialogue of diagnostic investigations of diode lasers, the basics of the utilized methods and strategies, lots of them pioneered by way of the writer to be fit-for-purpose and novel within the application;
  • systematic perception into laser degradation modes reminiscent of catastrophic optical harm, and a variety of applied sciences to extend the optical power of diode lasers;
  • coverage of easy techniques and strategies of laser reliability engineering with info on a customary advertisement excessive energy laser reliability try out program.

Semiconductor Laser Engineering, Reliability and Diagnostics displays the large services of the writer within the diode laser box either as a most sensible medical researcher in addition to a key developer of high-power hugely trustworthy units. With worthwhile functional recommendation, this new reference booklet is suited for training researchers in diode laser applied sciences, and to postgraduate engineering students. 

Dr. Peter W. Epperlein is know-how advisor together with his personal semiconductor know-how consulting company Pwe-PhotonicsElectronics-IssueResolution within the united kingdom. He appears to be like again at a thirty years occupation in leading edge photonics and electronics industries with concentrate on rising applied sciences, either in worldwide and start-up businesses, together with IBM, Hewlett-Packard, Agilent applied sciences, Philips/NXP, Essient Photonics and IBM/JDSU Laser firm. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) levels in physics, magna cum laude, from the collage of Stuttgart, Germany.

Dr. Epperlein is an the world over famous professional in compound semiconductor and diode laser applied sciences. He has finished R&D in lots of equipment parts resembling semiconductor lasers, LEDs, optical modulators, quantum good units, resonant tunneling units, FETs, and superconducting tunnel junctions and built-in circuits. His pioneering paintings on subtle diagnostic learn has resulted in many world’s first experiences and has been followed by way of different researchers in academia and undefined. He authored greater than seventy peer-reviewed magazine papers, released greater than ten invention disclosures within the IBM Technical Disclosure Bulletin, has served as reviewer of various proposals for booklet in technical journals, and has gained 5 IBM study department Awards. His key achievements comprise the layout and fabrication of high-power, hugely trustworthy, unmarried mode diode lasers.

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Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices by Peter W. Epperlein


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